Academic Journal
Προβολή σε EDS

Stochastic Reliability-Growth: A Model for Fault-Removal in Computer-Programs and Hardware-Designs

Λεπτομέρειες βιβλιογραφικής εγγραφής
Τίτλος: Stochastic Reliability-Growth: A Model for Fault-Removal in Computer-Programs and Hardware-Designs
Συγγραφείς: Littlewood, Bev
Πηγή: IEEE Transactions on Reliability IEEE Trans. Rel. Reliability, IEEE Transactions on. R-30(4):313-320 Oct, 1981
Βάση Δεδομένων: IEEE Xplore Digital Library
FullText Text:
  Availability: 0
Header DbId: edseee
DbLabel: IEEE Xplore Digital Library
An: edseee.5221099
RelevancyScore: 833
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 833.149658203125
IllustrationInfo
Items – Name: Title
  Label: Title
  Group: Ti
  Data: Stochastic Reliability-Growth: A Model for Fault-Removal in Computer-Programs and Hardware-Designs
– Name: Author
  Label: Authors
  Group: Au
  Data: <searchLink fieldCode="AR" term="%22Littlewood%2C+Bev%22">Littlewood, Bev</searchLink>
– Name: TitleSource
  Label: Source
  Group: Src
  Data: IEEE Transactions on Reliability IEEE Trans. Rel. Reliability, IEEE Transactions on. R-30(4):313-320 Oct, 1981
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=edseee&AN=edseee.5221099
RecordInfo BibRecord:
  BibEntity:
    Identifiers:
      – Type: doi
        Value: 10.1109/TR.1981.5221099
    PhysicalDescription:
      Pagination:
        StartPage: 313
    Titles:
      – TitleFull: Stochastic Reliability-Growth: A Model for Fault-Removal in Computer-Programs and Hardware-Designs
        Type: main
  BibRelationships:
    HasContributorRelationships:
      – PersonEntity:
          Name:
            NameFull: Littlewood, Bev
    IsPartOfRelationships:
      – BibEntity:
          Dates:
            – D: 01
              M: 10
              Type: published
              Y: 1981
          Identifiers:
            – Type: issn-print
              Value: 00189529
            – Type: issn-print
              Value: 15581721
            – Type: issn-locals
              Value: edseee.IEEEJournals
          Numbering:
            – Type: volume
              Value: R-30
            – Type: issue
              Value: 4
          Titles:
            – TitleFull: IEEE Transactions on Reliability, Reliability, IEEE Transactions on, IEEE Trans. Rel.
              Type: main
ResultId 1