Conference
Environmental stress screening for a massively parallel vision computer
| Τίτλος: | Environmental stress screening for a massively parallel vision computer |
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| Συγγραφείς: | Kostic, A.D., Wallace, R. |
| Πηγή: | Proceedings of 1996 Annual Reliability and Maintainability Symposium Reliability and maintainability Reliability and Maintainability Symposium, 1996 Proceedings. International Symposium on Product Quality and Integrity., Annual. :173-176 1996 |
| Relation: | Proceedings of 1996 Annual Reliability and Maintainability Symposium |
| Βάση Δεδομένων: | IEEE Xplore Digital Library |
| FullText | Text: Availability: 0 |
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| Header | DbId: edseee DbLabel: IEEE Xplore Digital Library An: edseee.500659 RelevancyScore: 941 AccessLevel: 2 PubType: Conference PubTypeId: conference PreciseRelevancyScore: 941.129516601563 |
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| Items | – Name: Title Label: Title Group: Ti Data: Environmental stress screening for a massively parallel vision computer – Name: Author Label: Authors Group: Au Data: <searchLink fieldCode="AR" term="%22Kostic%2C+A%2ED%2E%22">Kostic, A.D.</searchLink><br /><searchLink fieldCode="AR" term="%22Wallace%2C+R%2E%22">Wallace, R.</searchLink> – Name: TitleSource Label: Source Group: Src Data: Proceedings of 1996 Annual Reliability and Maintainability Symposium Reliability and maintainability Reliability and Maintainability Symposium, 1996 Proceedings. International Symposium on Product Quality and Integrity., Annual. :173-176 1996 – Name: NoteTitleSource Label: Relation Group: SrcInfo Data: Proceedings of 1996 Annual Reliability and Maintainability Symposium |
| PLink | https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=edseee&AN=edseee.500659 |
| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.1109/RAMS.1996.500659 PhysicalDescription: Pagination: PageCount: 4 StartPage: 173 Titles: – TitleFull: Environmental stress screening for a massively parallel vision computer Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Kostic, A.D. – PersonEntity: Name: NameFull: Wallace, R. IsPartOfRelationships: – BibEntity: Dates: – D: 01 M: 01 Type: published Y: 1996 Identifiers: – Type: isbn-print Value: 0780331125 – Type: isbn-print Value: 9780780331129 – Type: issn-print Value: 0149144X – Type: issn-locals Value: edseee.IEEEConferenc Titles: – TitleFull: Proceedings of 1996 Annual Reliability and Maintainability Symposium, Reliability and Maintainability Symposium, 1996 Proceedings. International Symposium on Product Quality and Integrity., Annual, Reliability and maintainability Type: main |
| ResultId | 1 |