Conference
Parallel Genetic Algorithm of Test Generation For Digital Circuits
| Title: | Parallel Genetic Algorithm of Test Generation For Digital Circuits |
|---|---|
| Authors: | Skobtsov, Y.A., El-Khatib, A.I., Ivanov, D.E. |
| Source: | 2006 International Conference - Modern Problems of Radio Engineering, Telecommunications, and Computer Science Modern Problems of Radio Engineering, Telecommunications, and Computer Science, 2006. TCSET 2006. International Conference. :129-131 Feb, 2006 |
| Relation: | 2006 International Conference - Modern Problems of Radio Engineering, Telecommunications, and Computer Science |
| Database: | IEEE Xplore Digital Library |
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