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Parallel Genetic Algorithm of Test Generation For Digital Circuits

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Τίτλος: Parallel Genetic Algorithm of Test Generation For Digital Circuits
Συγγραφείς: Skobtsov, Y.A., El-Khatib, A.I., Ivanov, D.E.
Πηγή: 2006 International Conference - Modern Problems of Radio Engineering, Telecommunications, and Computer Science Modern Problems of Radio Engineering, Telecommunications, and Computer Science, 2006. TCSET 2006. International Conference. :129-131 Feb, 2006
Relation: 2006 International Conference - Modern Problems of Radio Engineering, Telecommunications, and Computer Science
Βάση Δεδομένων: IEEE Xplore Digital Library
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        Value: 10.1109/TCSET.2006.4404471
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        StartPage: 129
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      – TitleFull: Parallel Genetic Algorithm of Test Generation For Digital Circuits
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