Conference
Parallel Genetic Algorithm of Test Generation For Digital Circuits
| Τίτλος: | Parallel Genetic Algorithm of Test Generation For Digital Circuits |
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| Συγγραφείς: | Skobtsov, Y.A., El-Khatib, A.I., Ivanov, D.E. |
| Πηγή: | 2006 International Conference - Modern Problems of Radio Engineering, Telecommunications, and Computer Science Modern Problems of Radio Engineering, Telecommunications, and Computer Science, 2006. TCSET 2006. International Conference. :129-131 Feb, 2006 |
| Relation: | 2006 International Conference - Modern Problems of Radio Engineering, Telecommunications, and Computer Science |
| Βάση Δεδομένων: | IEEE Xplore Digital Library |
| ISBN: | 9665535072 9789665535072 |
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| DOI: | 10.1109/TCSET.2006.4404471 |