APA (7th ed.) Citation

Skobtsov, Y., El-Khatib, A., & Ivanov, D. (2006). Parallel Genetic Algorithm of Test Generation For Digital Circuits. 2006 International Conference - Modern Problems of Radio Engineering, Telecommunications, and Computer Science, Modern Problems of Radio Engineering, Telecommunications, and Computer Science, 2006. TCSET 2006. International Conference, 129. https://doi.org/10.1109/TCSET.2006.4404471

Chicago Style (17th ed.) Citation

Skobtsov, Y.A, A.I El-Khatib, and D.E Ivanov. "Parallel Genetic Algorithm of Test Generation For Digital Circuits." 2006 International Conference - Modern Problems of Radio Engineering, Telecommunications, and Computer Science, Modern Problems of Radio Engineering, Telecommunications, and Computer Science, 2006. TCSET 2006. International Conference 2006: 129. https://doi.org/10.1109/TCSET.2006.4404471.

MLA (9th ed.) Citation

Skobtsov, Y.A, et al. "Parallel Genetic Algorithm of Test Generation For Digital Circuits." 2006 International Conference - Modern Problems of Radio Engineering, Telecommunications, and Computer Science, Modern Problems of Radio Engineering, Telecommunications, and Computer Science, 2006. TCSET 2006. International Conference, 2006, p. 129, https://doi.org/10.1109/TCSET.2006.4404471.