Conference
An introduction to computer algorithms designed to facilitate I/sub DDT/ current testing of CMOS circuits
| Τίτλος: | An introduction to computer algorithms designed to facilitate I/sub DDT/ current testing of CMOS circuits |
|---|---|
| Συγγραφείς: | Thomas, S. |
| Πηγή: | Proceedings. 2005 IEEE International Workshop on Current and Defect Based Testing, 2005. DBT 2005. Current and Defect Based Testing Current and Defect Based Testing, 2005. DBT 2005. Proceedings. 2005 IEEE International Workshop on. :71-76 2005 |
| Relation: | Proceedings. 2005 IEEE International Workshop on Current and Defect Based Testing |
| Βάση Δεδομένων: | IEEE Xplore Digital Library |
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