Conference
Unified Sarcasm and Humor Detection using Polarity- Sensitive BERT (PS-BERT)
| Τίτλος: | Unified Sarcasm and Humor Detection using Polarity- Sensitive BERT (PS-BERT) |
|---|---|
| Συγγραφείς: | Srivastava, Shivangi, Yadav, Sunil |
| Πηγή: | 2026 IEEE 5th World Conference on Applied Intelligence and Computing (AIC) Applied Intelligence and Computing (AIC), 2026 IEEE 5th World Conference on. :1443-1449 Aug, 2026 |
| Relation: | 2026 IEEE 5th World Conference on Applied Intelligence and Computing (AIC) |
| Βάση Δεδομένων: | IEEE Xplore Digital Library |
| FullText | Text: Availability: 0 |
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| Header | DbId: edseee DbLabel: IEEE Xplore Digital Library An: edseee.11716882 RelevancyScore: 1178 AccessLevel: 2 PubType: Conference PubTypeId: conference PreciseRelevancyScore: 1177.9765625 |
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| Items | – Name: Title Label: Title Group: Ti Data: Unified Sarcasm and Humor Detection using Polarity- Sensitive BERT (PS-BERT) – Name: Author Label: Authors Group: Au Data: <searchLink fieldCode="AR" term="%22Srivastava%2C+Shivangi%22">Srivastava, Shivangi</searchLink><br /><searchLink fieldCode="AR" term="%22Yadav%2C+Sunil%22">Yadav, Sunil</searchLink> – Name: TitleSource Label: Source Group: Src Data: 2026 IEEE 5th World Conference on Applied Intelligence and Computing (AIC) Applied Intelligence and Computing (AIC), 2026 IEEE 5th World Conference on. :1443-1449 Aug, 2026 – Name: NoteTitleSource Label: Relation Group: SrcInfo Data: 2026 IEEE 5th World Conference on Applied Intelligence and Computing (AIC) |
| PLink | https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=edseee&AN=edseee.11716882 |
| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.1109/AIC70896.2026.11716882 PhysicalDescription: Pagination: PageCount: 7 StartPage: 1443 Titles: – TitleFull: Unified Sarcasm and Humor Detection using Polarity- Sensitive BERT (PS-BERT) Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Srivastava, Shivangi – PersonEntity: Name: NameFull: Yadav, Sunil IsPartOfRelationships: – BibEntity: Dates: – D: 29 M: 08 Type: published Y: 2026 Identifiers: – Type: isbn-print Value: 9798319518989 – Type: isbn-print Value: 9798319518996 – Type: issn-locals Value: edseee.IEEEConferenc Titles: – TitleFull: 2026 IEEE 5th World Conference on Applied Intelligence and Computing (AIC), Applied Intelligence and Computing (AIC), 2026 IEEE 5th World Conference on Type: main |
| ResultId | 1 |