Conference
Test-Oriented Taxonomy and Full-Stack Verification Flows for Digital Processing-Near-Memory Systems
| Τίτλος: | Test-Oriented Taxonomy and Full-Stack Verification Flows for Digital Processing-Near-Memory Systems |
|---|---|
| Συγγραφείς: | Yin, Jie, Zhou, Alex, Xue, Xiaoyong, Zeng, Xiaoyang |
| Πηγή: | 2026 IEEE International Test Conference in Asia (ITC-Asia) Test Conference in Asia (ITC-Asia), 2026 IEEE International. :1-5 Aug, 2026 |
| Relation: | 2026 IEEE International Test Conference in Asia (ITC-Asia) |
| Βάση Δεδομένων: | IEEE Xplore Digital Library |
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