Conference
A Structural Analysis Framework for Interpreting Test Point Selection Methods
| Τίτλος: | A Structural Analysis Framework for Interpreting Test Point Selection Methods |
|---|---|
| Συγγραφείς: | Wang, Senling, Chen, Junqi, Sasaki, Shoya, Kai, Hiroshi, Higami, Yoshinobu, Yotsuyanagi, Hiroyuki, Ni, Tianming, Wen, Xiaoqing, Takahashi, Hiroshi |
| Πηγή: | 2026 IEEE International Test Conference in Asia (ITC-Asia) Test Conference in Asia (ITC-Asia), 2026 IEEE International. :1-6 Aug, 2026 |
| Relation: | 2026 IEEE International Test Conference in Asia (ITC-Asia) |
| Βάση Δεδομένων: | IEEE Xplore Digital Library |
| FullText | Text: Availability: 0 |
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| Header | DbId: edseee DbLabel: IEEE Xplore Digital Library An: edseee.11710873 RelevancyScore: 1178 AccessLevel: 2 PubType: Conference PubTypeId: conference PreciseRelevancyScore: 1177.97521972656 |
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| Items | – Name: Title Label: Title Group: Ti Data: A Structural Analysis Framework for Interpreting Test Point Selection Methods – Name: Author Label: Authors Group: Au Data: <searchLink fieldCode="AR" term="%22Wang%2C+Senling%22">Wang, Senling</searchLink><br /><searchLink fieldCode="AR" term="%22Chen%2C+Junqi%22">Chen, Junqi</searchLink><br /><searchLink fieldCode="AR" term="%22Sasaki%2C+Shoya%22">Sasaki, Shoya</searchLink><br /><searchLink fieldCode="AR" term="%22Kai%2C+Hiroshi%22">Kai, Hiroshi</searchLink><br /><searchLink fieldCode="AR" term="%22Higami%2C+Yoshinobu%22">Higami, Yoshinobu</searchLink><br /><searchLink fieldCode="AR" term="%22Yotsuyanagi%2C+Hiroyuki%22">Yotsuyanagi, Hiroyuki</searchLink><br /><searchLink fieldCode="AR" term="%22Ni%2C+Tianming%22">Ni, Tianming</searchLink><br /><searchLink fieldCode="AR" term="%22Wen%2C+Xiaoqing%22">Wen, Xiaoqing</searchLink><br /><searchLink fieldCode="AR" term="%22Takahashi%2C+Hiroshi%22">Takahashi, Hiroshi</searchLink> – Name: TitleSource Label: Source Group: Src Data: 2026 IEEE International Test Conference in Asia (ITC-Asia) Test Conference in Asia (ITC-Asia), 2026 IEEE International. :1-6 Aug, 2026 – Name: NoteTitleSource Label: Relation Group: SrcInfo Data: 2026 IEEE International Test Conference in Asia (ITC-Asia) |
| PLink | https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=edseee&AN=edseee.11710873 |
| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.1109/ITC-Asia71864.2026.11710873 PhysicalDescription: Pagination: PageCount: 6 StartPage: 1 Titles: – TitleFull: A Structural Analysis Framework for Interpreting Test Point Selection Methods Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Wang, Senling – PersonEntity: Name: NameFull: Chen, Junqi – PersonEntity: Name: NameFull: Sasaki, Shoya – PersonEntity: Name: NameFull: Kai, Hiroshi – PersonEntity: Name: NameFull: Higami, Yoshinobu – PersonEntity: Name: NameFull: Yotsuyanagi, Hiroyuki – PersonEntity: Name: NameFull: Ni, Tianming – PersonEntity: Name: NameFull: Wen, Xiaoqing – PersonEntity: Name: NameFull: Takahashi, Hiroshi IsPartOfRelationships: – BibEntity: Dates: – D: 19 M: 08 Type: published Y: 2026 Identifiers: – Type: isbn-print Value: 9798319504272 – Type: isbn-print Value: 9798319504289 – Type: issn-print Value: 2768069X – Type: issn-print Value: 27680681 – Type: issn-locals Value: edseee.IEEEConferenc Titles: – TitleFull: 2026 IEEE International Test Conference in Asia (ITC-Asia), Test Conference in Asia (ITC-Asia), 2026 IEEE International Type: main |
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