Wang, S., Chen, J., Sasaki, S., Kai, H., Higami, Y., Yotsuyanagi, H., . . . Takahashi, H. (2026). A Structural Analysis Framework for Interpreting Test Point Selection Methods. 2026 IEEE International Test Conference in Asia (ITC-Asia), Test Conference in Asia (ITC-Asia), 2026 IEEE International, 1. https://doi.org/10.1109/ITC-Asia71864.2026.11710873
Παραπομπή σε μορφή Chicago (17η εκδ.)Wang, Senling, Junqi Chen, Shoya Sasaki, Hiroshi Kai, Yoshinobu Higami, Hiroyuki Yotsuyanagi, Tianming Ni, Xiaoqing Wen, και Hiroshi Takahashi. "A Structural Analysis Framework for Interpreting Test Point Selection Methods." 2026 IEEE International Test Conference in Asia (ITC-Asia), Test Conference in Asia (ITC-Asia), 2026 IEEE International 2026: 1. https://doi.org/10.1109/ITC-Asia71864.2026.11710873.
Παραπομπή σε μορφή MLA (9th εκδ.)Wang, Senling, et al. "A Structural Analysis Framework for Interpreting Test Point Selection Methods." 2026 IEEE International Test Conference in Asia (ITC-Asia), Test Conference in Asia (ITC-Asia), 2026 IEEE International, 2026, p. 1, https://doi.org/10.1109/ITC-Asia71864.2026.11710873.