Conference
FPGA-Based Fault List Pruning and Selective Hardening for Early Functional Safety Assessment
| Τίτλος: | FPGA-Based Fault List Pruning and Selective Hardening for Early Functional Safety Assessment |
|---|---|
| Συγγραφείς: | Sun, Yutao, Chang, Jiatong, Zheng, Zhifei, Fei, Siyang, Bian, Yanhao, Wang, Zhijun |
| Πηγή: | 2026 IEEE International Test Conference in Asia (ITC-Asia) Test Conference in Asia (ITC-Asia), 2026 IEEE International. :1-6 Aug, 2026 |
| Relation: | 2026 IEEE International Test Conference in Asia (ITC-Asia) |
| Βάση Δεδομένων: | IEEE Xplore Digital Library |
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