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FPGA-Based Fault List Pruning and Selective Hardening for Early Functional Safety Assessment

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Τίτλος: FPGA-Based Fault List Pruning and Selective Hardening for Early Functional Safety Assessment
Συγγραφείς: Sun, Yutao, Chang, Jiatong, Zheng, Zhifei, Fei, Siyang, Bian, Yanhao, Wang, Zhijun
Πηγή: 2026 IEEE International Test Conference in Asia (ITC-Asia) Test Conference in Asia (ITC-Asia), 2026 IEEE International. :1-6 Aug, 2026
Relation: 2026 IEEE International Test Conference in Asia (ITC-Asia)
Βάση Δεδομένων: IEEE Xplore Digital Library
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PubType: Conference
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  Data: FPGA-Based Fault List Pruning and Selective Hardening for Early Functional Safety Assessment
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  Data: <searchLink fieldCode="AR" term="%22Sun%2C+Yutao%22">Sun, Yutao</searchLink><br /><searchLink fieldCode="AR" term="%22Chang%2C+Jiatong%22">Chang, Jiatong</searchLink><br /><searchLink fieldCode="AR" term="%22Zheng%2C+Zhifei%22">Zheng, Zhifei</searchLink><br /><searchLink fieldCode="AR" term="%22Fei%2C+Siyang%22">Fei, Siyang</searchLink><br /><searchLink fieldCode="AR" term="%22Bian%2C+Yanhao%22">Bian, Yanhao</searchLink><br /><searchLink fieldCode="AR" term="%22Wang%2C+Zhijun%22">Wang, Zhijun</searchLink>
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  Data: 2026 IEEE International Test Conference in Asia (ITC-Asia) Test Conference in Asia (ITC-Asia), 2026 IEEE International. :1-6 Aug, 2026
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  Data: 2026 IEEE International Test Conference in Asia (ITC-Asia)
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        Value: 10.1109/ITC-Asia71864.2026.11710821
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      – TitleFull: FPGA-Based Fault List Pruning and Selective Hardening for Early Functional Safety Assessment
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            NameFull: Sun, Yutao
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            NameFull: Chang, Jiatong
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            NameFull: Zheng, Zhifei
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            NameFull: Bian, Yanhao
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            NameFull: Wang, Zhijun
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              Y: 2026
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