Sun, Y., Chang, J., Zheng, Z., Fei, S., Bian, Y., & Wang, Z. (2026). FPGA-Based Fault List Pruning and Selective Hardening for Early Functional Safety Assessment. 2026 IEEE International Test Conference in Asia (ITC-Asia), Test Conference in Asia (ITC-Asia), 2026 IEEE International, 1. https://doi.org/10.1109/ITC-Asia71864.2026.11710821
Παραπομπή σε μορφή Chicago (17η εκδ.)Sun, Yutao, Jiatong Chang, Zhifei Zheng, Siyang Fei, Yanhao Bian, και Zhijun Wang. "FPGA-Based Fault List Pruning and Selective Hardening for Early Functional Safety Assessment." 2026 IEEE International Test Conference in Asia (ITC-Asia), Test Conference in Asia (ITC-Asia), 2026 IEEE International 2026: 1. https://doi.org/10.1109/ITC-Asia71864.2026.11710821.
Παραπομπή σε μορφή MLA (9th εκδ.)Sun, Yutao, et al. "FPGA-Based Fault List Pruning and Selective Hardening for Early Functional Safety Assessment." 2026 IEEE International Test Conference in Asia (ITC-Asia), Test Conference in Asia (ITC-Asia), 2026 IEEE International, 2026, p. 1, https://doi.org/10.1109/ITC-Asia71864.2026.11710821.