Conference
A Novel Partial Node Discharge Comparator Technique Enabling Sub $11 \mu ~\mathrm{W}$ for High-Speed Applications
| Title: | A Novel Partial Node Discharge Comparator Technique Enabling Sub $11 \mu ~\mathrm{W}$ for High-Speed Applications |
|---|---|
| Authors: | Korday, Soham, Rathore, Sunil |
| Source: | 2026 30th International Symposium on VLSI Design and Test (VDAT) VLSI Design and Test (VDAT), 2026 30th International Symposium on. :45-50 Aug, 2026 |
| Relation: | 2026 30th International Symposium on VLSI Design and Test (VDAT) |
| Database: | IEEE Xplore Digital Library |
| FullText | Text: Availability: 0 |
|---|---|
| Header | DbId: edseee DbLabel: IEEE Xplore Digital Library An: edseee.11704550 RelevancyScore: 1178 AccessLevel: 2 PubType: Conference PubTypeId: conference PreciseRelevancyScore: 1177.97534179688 |
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| Items | – Name: Title Label: Title Group: Ti Data: A Novel Partial Node Discharge Comparator Technique Enabling Sub $11 \mu ~\mathrm{W}$ for High-Speed Applications – Name: Author Label: Authors Group: Au Data: <searchLink fieldCode="AR" term="%22Korday%2C+Soham%22">Korday, Soham</searchLink><br /><searchLink fieldCode="AR" term="%22Rathore%2C+Sunil%22">Rathore, Sunil</searchLink> – Name: TitleSource Label: Source Group: Src Data: 2026 30th International Symposium on VLSI Design and Test (VDAT) VLSI Design and Test (VDAT), 2026 30th International Symposium on. :45-50 Aug, 2026 – Name: NoteTitleSource Label: Relation Group: SrcInfo Data: 2026 30th International Symposium on VLSI Design and Test (VDAT) |
| PLink | https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=edseee&AN=edseee.11704550 |
| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.1109/VDAT72243.2026.11704550 PhysicalDescription: Pagination: PageCount: 6 StartPage: 45 Titles: – TitleFull: A Novel Partial Node Discharge Comparator Technique Enabling Sub $11 \mu ~\mathrm{W}$ for High-Speed Applications Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Korday, Soham – PersonEntity: Name: NameFull: Rathore, Sunil IsPartOfRelationships: – BibEntity: Dates: – D: 20 M: 08 Type: published Y: 2026 Identifiers: – Type: isbn-print Value: 9798319524782 – Type: isbn-print Value: 9798319524799 – Type: issn-locals Value: edseee.IEEEConferenc Titles: – TitleFull: 2026 30th International Symposium on VLSI Design and Test (VDAT), VLSI Design and Test (VDAT), 2026 30th International Symposium on Type: main |
| ResultId | 1 |