Optimization of a Multimodal Deep Learning Model for Warpage Prediction of Fan-Out Wafer-Level Packaging

Λεπτομέρειες βιβλιογραφικής εγγραφής
Τίτλος: Optimization of a Multimodal Deep Learning Model for Warpage Prediction of Fan-Out Wafer-Level Packaging
Συγγραφείς: Zhao, Xiaohui, Jia, Yuxi
Πηγή: 2026 27th International Conference on Electronic Packaging Technology (ICEPT) Electronic Packaging Technology (ICEPT), 2026 27th International Conference on. :1-6 Aug, 2026
Relation: 2026 27th International Conference on Electronic Packaging Technology (ICEPT)
Βάση Δεδομένων: IEEE Xplore Digital Library