Predicting Structure-Dependent Dielectric Responses in High-k Oxides using Physics-Informed Graph Neural Networks

Λεπτομέρειες βιβλιογραφικής εγγραφής
Τίτλος: Predicting Structure-Dependent Dielectric Responses in High-k Oxides using Physics-Informed Graph Neural Networks
Συγγραφείς: Cao, Liang, Lu, Linkang, Tang, Jiayi, Xu, Guanghui, Li, Ming
Πηγή: 2026 27th International Conference on Electronic Packaging Technology (ICEPT) Electronic Packaging Technology (ICEPT), 2026 27th International Conference on. :1-6 Aug, 2026
Relation: 2026 27th International Conference on Electronic Packaging Technology (ICEPT)
Βάση Δεδομένων: IEEE Xplore Digital Library