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Functional Safety Redundant Monitoring Design Method for Automotive-Grade Brake Control Chip

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Τίτλος: Functional Safety Redundant Monitoring Design Method for Automotive-Grade Brake Control Chip
Συγγραφείς: Xi, Wenxia, Xia, Xianzhao, Zhao, Rui, Guo, Wei, Li, Yujia, Fu, Yue, Zhai, Ruiqing, Yan, Xu
Πηγή: 2026 5th International Symposium on Semiconductor and Electronic Technology (ISSET) Semiconductor and Electronic Technology (ISSET), 2026 5th International Symposium on. :511-515 Jul, 2026
Relation: 2026 5th International Symposium on Semiconductor and Electronic Technology (ISSET)
Βάση Δεδομένων: IEEE Xplore Digital Library
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Header DbId: edseee
DbLabel: IEEE Xplore Digital Library
An: edseee.11682140
RelevancyScore: 1161
AccessLevel: 2
PubType: Conference
PubTypeId: conference
PreciseRelevancyScore: 1160.63977050781
IllustrationInfo
Items – Name: Title
  Label: Title
  Group: Ti
  Data: Functional Safety Redundant Monitoring Design Method for Automotive-Grade Brake Control Chip
– Name: Author
  Label: Authors
  Group: Au
  Data: <searchLink fieldCode="AR" term="%22Xi%2C+Wenxia%22">Xi, Wenxia</searchLink><br /><searchLink fieldCode="AR" term="%22Xia%2C+Xianzhao%22">Xia, Xianzhao</searchLink><br /><searchLink fieldCode="AR" term="%22Zhao%2C+Rui%22">Zhao, Rui</searchLink><br /><searchLink fieldCode="AR" term="%22Guo%2C+Wei%22">Guo, Wei</searchLink><br /><searchLink fieldCode="AR" term="%22Li%2C+Yujia%22">Li, Yujia</searchLink><br /><searchLink fieldCode="AR" term="%22Fu%2C+Yue%22">Fu, Yue</searchLink><br /><searchLink fieldCode="AR" term="%22Zhai%2C+Ruiqing%22">Zhai, Ruiqing</searchLink><br /><searchLink fieldCode="AR" term="%22Yan%2C+Xu%22">Yan, Xu</searchLink>
– Name: TitleSource
  Label: Source
  Group: Src
  Data: 2026 5th International Symposium on Semiconductor and Electronic Technology (ISSET) Semiconductor and Electronic Technology (ISSET), 2026 5th International Symposium on. :511-515 Jul, 2026
– Name: NoteTitleSource
  Label: Relation
  Group: SrcInfo
  Data: 2026 5th International Symposium on Semiconductor and Electronic Technology (ISSET)
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=edseee&AN=edseee.11682140
RecordInfo BibRecord:
  BibEntity:
    Identifiers:
      – Type: doi
        Value: 10.1109/ISSET70600.2026.11682140
    PhysicalDescription:
      Pagination:
        PageCount: 5
        StartPage: 511
    Titles:
      – TitleFull: Functional Safety Redundant Monitoring Design Method for Automotive-Grade Brake Control Chip
        Type: main
  BibRelationships:
    HasContributorRelationships:
      – PersonEntity:
          Name:
            NameFull: Xi, Wenxia
      – PersonEntity:
          Name:
            NameFull: Xia, Xianzhao
      – PersonEntity:
          Name:
            NameFull: Zhao, Rui
      – PersonEntity:
          Name:
            NameFull: Guo, Wei
      – PersonEntity:
          Name:
            NameFull: Li, Yujia
      – PersonEntity:
          Name:
            NameFull: Fu, Yue
      – PersonEntity:
          Name:
            NameFull: Zhai, Ruiqing
      – PersonEntity:
          Name:
            NameFull: Yan, Xu
    IsPartOfRelationships:
      – BibEntity:
          Dates:
            – D: 24
              M: 07
              Type: published
              Y: 2026
          Identifiers:
            – Type: isbn-print
              Value: 9798319518224
            – Type: isbn-print
              Value: 9798319518217
            – Type: isbn-print
              Value: 9798319518231
            – Type: issn-locals
              Value: edseee.IEEEConferenc
          Titles:
            – TitleFull: 2026 5th International Symposium on Semiconductor and Electronic Technology (ISSET), Semiconductor and Electronic Technology (ISSET), 2026 5th International Symposium on
              Type: main
ResultId 1