Xi, W., Xia, X., Zhao, R., Guo, W., Li, Y., Fu, Y., . . . Yan, X. (2026). Functional Safety Redundant Monitoring Design Method for Automotive-Grade Brake Control Chip. 2026 5th International Symposium on Semiconductor and Electronic Technology (ISSET), Semiconductor and Electronic Technology (ISSET), 2026 5th International Symposium on, 511. https://doi.org/10.1109/ISSET70600.2026.11682140
Παραπομπή σε μορφή Chicago (17η εκδ.)Xi, Wenxia, Xianzhao Xia, Rui Zhao, Wei Guo, Yujia Li, Yue Fu, Ruiqing Zhai, και Xu Yan. "Functional Safety Redundant Monitoring Design Method for Automotive-Grade Brake Control Chip." 2026 5th International Symposium on Semiconductor and Electronic Technology (ISSET), Semiconductor and Electronic Technology (ISSET), 2026 5th International Symposium on 2026: 511. https://doi.org/10.1109/ISSET70600.2026.11682140.
Παραπομπή σε μορφή MLA (9th εκδ.)Xi, Wenxia, et al. "Functional Safety Redundant Monitoring Design Method for Automotive-Grade Brake Control Chip." 2026 5th International Symposium on Semiconductor and Electronic Technology (ISSET), Semiconductor and Electronic Technology (ISSET), 2026 5th International Symposium on, 2026, p. 511, https://doi.org/10.1109/ISSET70600.2026.11682140.