An Intelligent Computational Pipeline for Epitaxial Layer Thickness Estimation via Multi-Angle Spectral Interferometry

Λεπτομέρειες βιβλιογραφικής εγγραφής
Τίτλος: An Intelligent Computational Pipeline for Epitaxial Layer Thickness Estimation via Multi-Angle Spectral Interferometry
Συγγραφείς: Li, Haocong, Yang, Hao, Lv, Yifan, Liu, Jingyi
Πηγή: 2026 IEEE 2nd International Conference on Electronics, Energy Systems and Power Engineering (EESPE) Electronics, Energy Systems and Power Engineering (EESPE), 2026 IEEE 2nd International Conference on. :2134-2139 Jun, 2026
Relation: 2026 IEEE 2nd International Conference on Electronics, Energy Systems and Power Engineering (EESPE)
Βάση Δεδομένων: IEEE Xplore Digital Library