Conference

An Intelligent Computational Pipeline for Epitaxial Layer Thickness Estimation via Multi-Angle Spectral Interferometry

Bibliographic Details
Title: An Intelligent Computational Pipeline for Epitaxial Layer Thickness Estimation via Multi-Angle Spectral Interferometry
Authors: Li, Haocong, Yang, Hao, Lv, Yifan, Liu, Jingyi
Source: 2026 IEEE 2nd International Conference on Electronics, Energy Systems and Power Engineering (EESPE) Electronics, Energy Systems and Power Engineering (EESPE), 2026 IEEE 2nd International Conference on. :2134-2139 Jun, 2026
Relation: 2026 IEEE 2nd International Conference on Electronics, Energy Systems and Power Engineering (EESPE)
Database: IEEE Xplore Digital Library
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PubType: Conference
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  Data: An Intelligent Computational Pipeline for Epitaxial Layer Thickness Estimation via Multi-Angle Spectral Interferometry
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  Data: <searchLink fieldCode="AR" term="%22Li%2C+Haocong%22">Li, Haocong</searchLink><br /><searchLink fieldCode="AR" term="%22Yang%2C+Hao%22">Yang, Hao</searchLink><br /><searchLink fieldCode="AR" term="%22Lv%2C+Yifan%22">Lv, Yifan</searchLink><br /><searchLink fieldCode="AR" term="%22Liu%2C+Jingyi%22">Liu, Jingyi</searchLink>
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  Data: 2026 IEEE 2nd International Conference on Electronics, Energy Systems and Power Engineering (EESPE) Electronics, Energy Systems and Power Engineering (EESPE), 2026 IEEE 2nd International Conference on. :2134-2139 Jun, 2026
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  Data: 2026 IEEE 2nd International Conference on Electronics, Energy Systems and Power Engineering (EESPE)
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RecordInfo BibRecord:
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      – Type: doi
        Value: 10.1109/EESPE68405.2026.11648355
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        PageCount: 6
        StartPage: 2134
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      – TitleFull: An Intelligent Computational Pipeline for Epitaxial Layer Thickness Estimation via Multi-Angle Spectral Interferometry
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          Name:
            NameFull: Li, Haocong
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            NameFull: Yang, Hao
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            NameFull: Lv, Yifan
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            NameFull: Liu, Jingyi
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              M: 06
              Type: published
              Y: 2026
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