Li, H., Yang, H., Lv, Y., & Liu, J. (2026). An Intelligent Computational Pipeline for Epitaxial Layer Thickness Estimation via Multi-Angle Spectral Interferometry. 2026 IEEE 2nd International Conference on Electronics, Energy Systems and Power Engineering (EESPE), Electronics, Energy Systems and Power Engineering (EESPE), 2026 IEEE 2nd International Conference on, 2134. https://doi.org/10.1109/EESPE68405.2026.11648355
Παραπομπή σε μορφή Chicago (17η εκδ.)Li, Haocong, Hao Yang, Yifan Lv, και Jingyi Liu. "An Intelligent Computational Pipeline for Epitaxial Layer Thickness Estimation via Multi-Angle Spectral Interferometry." 2026 IEEE 2nd International Conference on Electronics, Energy Systems and Power Engineering (EESPE), Electronics, Energy Systems and Power Engineering (EESPE), 2026 IEEE 2nd International Conference on 2026: 2134. https://doi.org/10.1109/EESPE68405.2026.11648355.
Παραπομπή σε μορφή MLA (9th εκδ.)Li, Haocong, et al. "An Intelligent Computational Pipeline for Epitaxial Layer Thickness Estimation via Multi-Angle Spectral Interferometry." 2026 IEEE 2nd International Conference on Electronics, Energy Systems and Power Engineering (EESPE), Electronics, Energy Systems and Power Engineering (EESPE), 2026 IEEE 2nd International Conference on, 2026, p. 2134, https://doi.org/10.1109/EESPE68405.2026.11648355.