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Research on Terminal Analysis of Quality Inspection Data Interconnection Based on Edge Intelligent Data Processing Method

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Τίτλος: Research on Terminal Analysis of Quality Inspection Data Interconnection Based on Edge Intelligent Data Processing Method
Συγγραφείς: Yu, Ping, Xu, Hongwei, Ren, Qijun, Zhou, Pan
Πηγή: 2026 IEEE 2nd International Conference on Electronics, Energy Systems and Power Engineering (EESPE) Electronics, Energy Systems and Power Engineering (EESPE), 2026 IEEE 2nd International Conference on. :1710-1713 Jun, 2026
Relation: 2026 IEEE 2nd International Conference on Electronics, Energy Systems and Power Engineering (EESPE)
Βάση Δεδομένων: IEEE Xplore Digital Library
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DbLabel: IEEE Xplore Digital Library
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PubType: Conference
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  Data: Research on Terminal Analysis of Quality Inspection Data Interconnection Based on Edge Intelligent Data Processing Method
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  Data: <searchLink fieldCode="AR" term="%22Yu%2C+Ping%22">Yu, Ping</searchLink><br /><searchLink fieldCode="AR" term="%22Xu%2C+Hongwei%22">Xu, Hongwei</searchLink><br /><searchLink fieldCode="AR" term="%22Ren%2C+Qijun%22">Ren, Qijun</searchLink><br /><searchLink fieldCode="AR" term="%22Zhou%2C+Pan%22">Zhou, Pan</searchLink>
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  Data: 2026 IEEE 2nd International Conference on Electronics, Energy Systems and Power Engineering (EESPE) Electronics, Energy Systems and Power Engineering (EESPE), 2026 IEEE 2nd International Conference on. :1710-1713 Jun, 2026
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  Data: 2026 IEEE 2nd International Conference on Electronics, Energy Systems and Power Engineering (EESPE)
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RecordInfo BibRecord:
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      – Type: doi
        Value: 10.1109/EESPE68405.2026.11648290
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        PageCount: 4
        StartPage: 1710
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      – TitleFull: Research on Terminal Analysis of Quality Inspection Data Interconnection Based on Edge Intelligent Data Processing Method
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            NameFull: Yu, Ping
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            NameFull: Xu, Hongwei
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            NameFull: Ren, Qijun
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            NameFull: Zhou, Pan
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              Type: published
              Y: 2026
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