Conference
Innovative Memory Interconnect Architecture: Setting New Standards for Security, Safety and Performance in Real-Time Control MCUs
| Τίτλος: | Innovative Memory Interconnect Architecture: Setting New Standards for Security, Safety and Performance in Real-Time Control MCUs |
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| Συγγραφείς: | Pillai, Prasanth Viswanathan, Kottadamane, Varshashree, Langadi, Saya Goud, K, Labeeb, Kothuri, Naveen, Ravilla, Narendra, Pidaparthi, Ramakrishna, Chaudhari, Rohit, Maramreddy, Sivareddy |
| Πηγή: | 2026 IEEE 10th International Test Conference India (ITC India) Test Conference India (ITC India), 2026 IEEE 10th International. :1-6 Jul, 2026 |
| Relation: | 2026 IEEE 10th International Test Conference India (ITC India) |
| Βάση Δεδομένων: | IEEE Xplore Digital Library |
| FullText | Text: Availability: 0 |
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| Header | DbId: edseee DbLabel: IEEE Xplore Digital Library An: edseee.11646527 RelevancyScore: 1161 AccessLevel: 2 PubType: Conference PubTypeId: conference PreciseRelevancyScore: 1160.63916015625 |
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| PLink | https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=edseee&AN=edseee.11646527 |
| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.1109/ITCIndia70344.2026.11646527 PhysicalDescription: Pagination: PageCount: 6 StartPage: 1 Titles: – TitleFull: Innovative Memory Interconnect Architecture: Setting New Standards for Security, Safety and Performance in Real-Time Control MCUs Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Pillai, Prasanth Viswanathan – PersonEntity: Name: NameFull: Kottadamane, Varshashree – PersonEntity: Name: NameFull: Langadi, Saya Goud – PersonEntity: Name: NameFull: K, Labeeb – PersonEntity: Name: NameFull: Kothuri, Naveen – PersonEntity: Name: NameFull: Ravilla, Narendra – PersonEntity: Name: NameFull: Pidaparthi, Ramakrishna – PersonEntity: Name: NameFull: Chaudhari, Rohit – PersonEntity: Name: NameFull: Maramreddy, Sivareddy IsPartOfRelationships: – BibEntity: Dates: – D: 19 M: 07 Type: published Y: 2026 Identifiers: – Type: isbn-print Value: 9798319505316 – Type: isbn-print Value: 9798319505323 – Type: issn-print Value: 28338391 – Type: issn-print Value: 28338383 – Type: issn-locals Value: edseee.IEEEConferenc Titles: – TitleFull: 2026 IEEE 10th International Test Conference India (ITC India), Test Conference India (ITC India), 2026 IEEE 10th International Type: main |
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