Haratian, V., Akar, A., Cakar, B., & Tuzun, E. (2026). PR-Aware Automated Unit Test Generation: Challenges and Opportunities. 2026 IEEE 50th Annual Computers, Software, and Applications Conference (COMPSAC), Computers, Software, and Applications Conference (COMPSAC), 2026 IEEE 50th Annual, COMPSAC, 346. https://doi.org/10.1109/COMPSAC69091.2026.00055
Παραπομπή σε μορφή Chicago (17η εκδ.)Haratian, Vahid, Atakan Akar, Berk Cakar, και Eray Tuzun. "PR-Aware Automated Unit Test Generation: Challenges and Opportunities." 2026 IEEE 50th Annual Computers, Software, and Applications Conference (COMPSAC), Computers, Software, and Applications Conference (COMPSAC), 2026 IEEE 50th Annual, COMPSAC 2026: 346. https://doi.org/10.1109/COMPSAC69091.2026.00055.
Παραπομπή σε μορφή MLA (9th εκδ.)Haratian, Vahid, et al. "PR-Aware Automated Unit Test Generation: Challenges and Opportunities." 2026 IEEE 50th Annual Computers, Software, and Applications Conference (COMPSAC), Computers, Software, and Applications Conference (COMPSAC), 2026 IEEE 50th Annual, COMPSAC, 2026, p. 346, https://doi.org/10.1109/COMPSAC69091.2026.00055.