Conference
Προβολή σε EDS

Assessment of Temperature-Profiled MOX Measurements in Multi-Node Mobile IoT Platforms

Λεπτομέρειες βιβλιογραφικής εγγραφής
Τίτλος: Assessment of Temperature-Profiled MOX Measurements in Multi-Node Mobile IoT Platforms
Συγγραφείς: Panzardi, Enza, Tani, Marco, Landi, Elia, Fort, Ada, Mugnaini, Marco, Cappelli, Irene, Parrino, Stefano, Vignoli, Valerio
Πηγή: 2026 IEEE International Workshop on Metrology for Automotive (MetroAutomotive) Metrology for Automotive (MetroAutomotive), 2026 IEEE International Workshop on. :60-65 Jun, 2026
Relation: 2026 IEEE International Workshop on Metrology for Automotive (MetroAutomotive)
Βάση Δεδομένων: IEEE Xplore Digital Library
FullText Text:
  Availability: 0
Header DbId: edseee
DbLabel: IEEE Xplore Digital Library
An: edseee.11644625
RelevancyScore: 1161
AccessLevel: 2
PubType: Conference
PubTypeId: conference
PreciseRelevancyScore: 1160.62548828125
IllustrationInfo
Items – Name: Title
  Label: Title
  Group: Ti
  Data: Assessment of Temperature-Profiled MOX Measurements in Multi-Node Mobile IoT Platforms
– Name: Author
  Label: Authors
  Group: Au
  Data: <searchLink fieldCode="AR" term="%22Panzardi%2C+Enza%22">Panzardi, Enza</searchLink><br /><searchLink fieldCode="AR" term="%22Tani%2C+Marco%22">Tani, Marco</searchLink><br /><searchLink fieldCode="AR" term="%22Landi%2C+Elia%22">Landi, Elia</searchLink><br /><searchLink fieldCode="AR" term="%22Fort%2C+Ada%22">Fort, Ada</searchLink><br /><searchLink fieldCode="AR" term="%22Mugnaini%2C+Marco%22">Mugnaini, Marco</searchLink><br /><searchLink fieldCode="AR" term="%22Cappelli%2C+Irene%22">Cappelli, Irene</searchLink><br /><searchLink fieldCode="AR" term="%22Parrino%2C+Stefano%22">Parrino, Stefano</searchLink><br /><searchLink fieldCode="AR" term="%22Vignoli%2C+Valerio%22">Vignoli, Valerio</searchLink>
– Name: TitleSource
  Label: Source
  Group: Src
  Data: 2026 IEEE International Workshop on Metrology for Automotive (MetroAutomotive) Metrology for Automotive (MetroAutomotive), 2026 IEEE International Workshop on. :60-65 Jun, 2026
– Name: NoteTitleSource
  Label: Relation
  Group: SrcInfo
  Data: 2026 IEEE International Workshop on Metrology for Automotive (MetroAutomotive)
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=edseee&AN=edseee.11644625
RecordInfo BibRecord:
  BibEntity:
    Identifiers:
      – Type: doi
        Value: 10.1109/MetroAutomotive69354.2026.11644625
    PhysicalDescription:
      Pagination:
        PageCount: 6
        StartPage: 60
    Titles:
      – TitleFull: Assessment of Temperature-Profiled MOX Measurements in Multi-Node Mobile IoT Platforms
        Type: main
  BibRelationships:
    HasContributorRelationships:
      – PersonEntity:
          Name:
            NameFull: Panzardi, Enza
      – PersonEntity:
          Name:
            NameFull: Tani, Marco
      – PersonEntity:
          Name:
            NameFull: Landi, Elia
      – PersonEntity:
          Name:
            NameFull: Fort, Ada
      – PersonEntity:
          Name:
            NameFull: Mugnaini, Marco
      – PersonEntity:
          Name:
            NameFull: Cappelli, Irene
      – PersonEntity:
          Name:
            NameFull: Parrino, Stefano
      – PersonEntity:
          Name:
            NameFull: Vignoli, Valerio
    IsPartOfRelationships:
      – BibEntity:
          Dates:
            – D: 17
              M: 06
              Type: published
              Y: 2026
          Identifiers:
            – Type: isbn-print
              Value: 9798331551285
            – Type: isbn-print
              Value: 9798331551278
            – Type: isbn-print
              Value: 9798331551292
            – Type: issn-locals
              Value: edseee.IEEEConferenc
          Titles:
            – TitleFull: 2026 IEEE International Workshop on Metrology for Automotive (MetroAutomotive), Metrology for Automotive (MetroAutomotive), 2026 IEEE International Workshop on
              Type: main
ResultId 1