Panzardi, E., Tani, M., Landi, E., Fort, A., Mugnaini, M., Cappelli, I., . . . Vignoli, V. (2026). Assessment of Temperature-Profiled MOX Measurements in Multi-Node Mobile IoT Platforms. 2026 IEEE International Workshop on Metrology for Automotive (MetroAutomotive), Metrology for Automotive (MetroAutomotive), 2026 IEEE International Workshop on, 60. https://doi.org/10.1109/MetroAutomotive69354.2026.11644625
Παραπομπή σε μορφή Chicago (17η εκδ.)Panzardi, Enza, Marco Tani, Elia Landi, Ada Fort, Marco Mugnaini, Irene Cappelli, Stefano Parrino, και Valerio Vignoli. "Assessment of Temperature-Profiled MOX Measurements in Multi-Node Mobile IoT Platforms." 2026 IEEE International Workshop on Metrology for Automotive (MetroAutomotive), Metrology for Automotive (MetroAutomotive), 2026 IEEE International Workshop on 2026: 60. https://doi.org/10.1109/MetroAutomotive69354.2026.11644625.
Παραπομπή σε μορφή MLA (9th εκδ.)Panzardi, Enza, et al. "Assessment of Temperature-Profiled MOX Measurements in Multi-Node Mobile IoT Platforms." 2026 IEEE International Workshop on Metrology for Automotive (MetroAutomotive), Metrology for Automotive (MetroAutomotive), 2026 IEEE International Workshop on, 2026, p. 60, https://doi.org/10.1109/MetroAutomotive69354.2026.11644625.