Conference
Reducing Safety False-Positives in Parity-Based Security AES Using a Hardware Fault Classifier
| Τίτλος: | Reducing Safety False-Positives in Parity-Based Security AES Using a Hardware Fault Classifier |
|---|---|
| Συγγραφείς: | Thirion, Daniel, Daveau, Jean-Marc, Egloff, Valentin, Beroulle, Vincent, Roche, Philippe, Hely, David |
| Πηγή: | 2026 IEEE 32nd International Symposium on On-Line Testing and Robust System Design (IOLTS) On-Line Testing and Robust System Design (IOLTS), 2026 IEEE 32nd International Symposium on. :1-7 Jul, 2026 |
| Relation: | 2026 IEEE 32nd International Symposium on On-Line Testing and Robust System Design (IOLTS) |
| Βάση Δεδομένων: | IEEE Xplore Digital Library |
| FullText | Text: Availability: 0 |
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| PLink | https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=edseee&AN=edseee.11633851 |
| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.1109/IOLTS69666.2026.11633851 PhysicalDescription: Pagination: PageCount: 7 StartPage: 1 Titles: – TitleFull: Reducing Safety False-Positives in Parity-Based Security AES Using a Hardware Fault Classifier Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Thirion, Daniel – PersonEntity: Name: NameFull: Daveau, Jean-Marc – PersonEntity: Name: NameFull: Egloff, Valentin – PersonEntity: Name: NameFull: Beroulle, Vincent – PersonEntity: Name: NameFull: Roche, Philippe – PersonEntity: Name: NameFull: Hely, David IsPartOfRelationships: – BibEntity: Dates: – D: 01 M: 07 Type: published Y: 2026 Identifiers: – Type: isbn-print Value: 9798331546854 – Type: isbn-print Value: 9798331546861 – Type: issn-print Value: 19429401 – Type: issn-print Value: 19429398 – Type: issn-locals Value: edseee.IEEEConferenc Titles: – TitleFull: 2026 IEEE 32nd International Symposium on On-Line Testing and Robust System Design (IOLTS), On-Line Testing and Robust System Design (IOLTS), 2026 IEEE 32nd International Symposium on Type: main |
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