Thirion, D., Daveau, J., Egloff, V., Beroulle, V., Roche, P., & Hely, D. (2026). Reducing Safety False-Positives in Parity-Based Security AES Using a Hardware Fault Classifier. 2026 IEEE 32nd International Symposium on On-Line Testing and Robust System Design (IOLTS), On-Line Testing and Robust System Design (IOLTS), 2026 IEEE 32nd International Symposium on, 1. https://doi.org/10.1109/IOLTS69666.2026.11633851
Παραπομπή σε μορφή Chicago (17η εκδ.)Thirion, Daniel, Jean-Marc Daveau, Valentin Egloff, Vincent Beroulle, Philippe Roche, και David Hely. "Reducing Safety False-Positives in Parity-Based Security AES Using a Hardware Fault Classifier." 2026 IEEE 32nd International Symposium on On-Line Testing and Robust System Design (IOLTS), On-Line Testing and Robust System Design (IOLTS), 2026 IEEE 32nd International Symposium on 2026: 1. https://doi.org/10.1109/IOLTS69666.2026.11633851.
Παραπομπή σε μορφή MLA (9th εκδ.)Thirion, Daniel, et al. "Reducing Safety False-Positives in Parity-Based Security AES Using a Hardware Fault Classifier." 2026 IEEE 32nd International Symposium on On-Line Testing and Robust System Design (IOLTS), On-Line Testing and Robust System Design (IOLTS), 2026 IEEE 32nd International Symposium on, 2026, p. 1, https://doi.org/10.1109/IOLTS69666.2026.11633851.