Evaluating Generative AI for Functional Safety Analysis of Integrated Circuits

Λεπτομέρειες βιβλιογραφικής εγγραφής
Τίτλος: Evaluating Generative AI for Functional Safety Analysis of Integrated Circuits
Συγγραφείς: Ayache, Mouadh, Nardi, Alessandra, Singh, Aditya Raj, Davenport, Brian, Parthasarathy, Ganapathy, Cupaiuolo, Teo, Berekovic, Mladen, Mulhem, Saleh
Πηγή: 2026 IEEE 32nd International Symposium on On-Line Testing and Robust System Design (IOLTS) On-Line Testing and Robust System Design (IOLTS), 2026 IEEE 32nd International Symposium on. :1-5 Jul, 2026
Relation: 2026 IEEE 32nd International Symposium on On-Line Testing and Robust System Design (IOLTS)
Βάση Δεδομένων: IEEE Xplore Digital Library