Conference
Evaluating Generative AI for Functional Safety Analysis of Integrated Circuits
| Τίτλος: | Evaluating Generative AI for Functional Safety Analysis of Integrated Circuits |
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| Συγγραφείς: | Ayache, Mouadh, Nardi, Alessandra, Singh, Aditya Raj, Davenport, Brian, Parthasarathy, Ganapathy, Cupaiuolo, Teo, Berekovic, Mladen, Mulhem, Saleh |
| Πηγή: | 2026 IEEE 32nd International Symposium on On-Line Testing and Robust System Design (IOLTS) On-Line Testing and Robust System Design (IOLTS), 2026 IEEE 32nd International Symposium on. :1-5 Jul, 2026 |
| Relation: | 2026 IEEE 32nd International Symposium on On-Line Testing and Robust System Design (IOLTS) |
| Βάση Δεδομένων: | IEEE Xplore Digital Library |
| FullText | Text: Availability: 0 |
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| Header | DbId: edseee DbLabel: IEEE Xplore Digital Library An: edseee.11633655 RelevancyScore: 1161 AccessLevel: 2 PubType: Conference PubTypeId: conference PreciseRelevancyScore: 1160.63671875 |
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| PLink | https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=edseee&AN=edseee.11633655 |
| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.1109/IOLTS69666.2026.11633655 PhysicalDescription: Pagination: PageCount: 5 StartPage: 1 Titles: – TitleFull: Evaluating Generative AI for Functional Safety Analysis of Integrated Circuits Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Ayache, Mouadh – PersonEntity: Name: NameFull: Nardi, Alessandra – PersonEntity: Name: NameFull: Singh, Aditya Raj – PersonEntity: Name: NameFull: Davenport, Brian – PersonEntity: Name: NameFull: Parthasarathy, Ganapathy – PersonEntity: Name: NameFull: Cupaiuolo, Teo – PersonEntity: Name: NameFull: Berekovic, Mladen – PersonEntity: Name: NameFull: Mulhem, Saleh IsPartOfRelationships: – BibEntity: Dates: – D: 01 M: 07 Type: published Y: 2026 Identifiers: – Type: isbn-print Value: 9798331546854 – Type: isbn-print Value: 9798331546861 – Type: issn-print Value: 19429401 – Type: issn-print Value: 19429398 – Type: issn-locals Value: edseee.IEEEConferenc Titles: – TitleFull: 2026 IEEE 32nd International Symposium on On-Line Testing and Robust System Design (IOLTS), On-Line Testing and Robust System Design (IOLTS), 2026 IEEE 32nd International Symposium on Type: main |
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