Ayache, M., Nardi, A., Singh, A. R., Davenport, B., Parthasarathy, G., Cupaiuolo, T., . . . Mulhem, S. (2026). Evaluating Generative AI for Functional Safety Analysis of Integrated Circuits. 2026 IEEE 32nd International Symposium on On-Line Testing and Robust System Design (IOLTS), On-Line Testing and Robust System Design (IOLTS), 2026 IEEE 32nd International Symposium on, 1. https://doi.org/10.1109/IOLTS69666.2026.11633655
Παραπομπή σε μορφή Chicago (17η εκδ.)Ayache, Mouadh, Alessandra Nardi, Aditya Raj Singh, Brian Davenport, Ganapathy Parthasarathy, Teo Cupaiuolo, Mladen Berekovic, και Saleh Mulhem. "Evaluating Generative AI for Functional Safety Analysis of Integrated Circuits." 2026 IEEE 32nd International Symposium on On-Line Testing and Robust System Design (IOLTS), On-Line Testing and Robust System Design (IOLTS), 2026 IEEE 32nd International Symposium on 2026: 1. https://doi.org/10.1109/IOLTS69666.2026.11633655.
Παραπομπή σε μορφή MLA (9th εκδ.)Ayache, Mouadh, et al. "Evaluating Generative AI for Functional Safety Analysis of Integrated Circuits." 2026 IEEE 32nd International Symposium on On-Line Testing and Robust System Design (IOLTS), On-Line Testing and Robust System Design (IOLTS), 2026 IEEE 32nd International Symposium on, 2026, p. 1, https://doi.org/10.1109/IOLTS69666.2026.11633655.