Conference
Small-Sample Reliability Assessment Based on Bayesian Prior and Dynamic Wiener Process
| Τίτλος: | Small-Sample Reliability Assessment Based on Bayesian Prior and Dynamic Wiener Process |
|---|---|
| Συγγραφείς: | Sun, Minqi, Zhao, Jianyin, Qin, Yufeng, Hu, Youwei |
| Πηγή: | 2026 7th International Conference on Artificial Intelligence and Electromechanical Automation (AIEA) Artificial Intelligence and Electromechanical Automation (AIEA), 2026 7th International Conference on. :606-610 Jun, 2026 |
| Relation: | 2026 7th International Conference on Artificial Intelligence and Electromechanical Automation (AIEA) |
| Βάση Δεδομένων: | IEEE Xplore Digital Library |
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