Small-Sample Reliability Assessment Based on Bayesian Prior and Dynamic Wiener Process

Λεπτομέρειες βιβλιογραφικής εγγραφής
Τίτλος: Small-Sample Reliability Assessment Based on Bayesian Prior and Dynamic Wiener Process
Συγγραφείς: Sun, Minqi, Zhao, Jianyin, Qin, Yufeng, Hu, Youwei
Πηγή: 2026 7th International Conference on Artificial Intelligence and Electromechanical Automation (AIEA) Artificial Intelligence and Electromechanical Automation (AIEA), 2026 7th International Conference on. :606-610 Jun, 2026
Relation: 2026 7th International Conference on Artificial Intelligence and Electromechanical Automation (AIEA)
Βάση Δεδομένων: IEEE Xplore Digital Library
Περιγραφή
ISBN:9798319519719
9798319519702
9798319519726
DOI:10.1109/AIEA70743.2026.11632653