Sun, M., Zhao, J., Qin, Y., & Hu, Y. (2026). Small-Sample Reliability Assessment Based on Bayesian Prior and Dynamic Wiener Process. 2026 7th International Conference on Artificial Intelligence and Electromechanical Automation (AIEA), Artificial Intelligence and Electromechanical Automation (AIEA), 2026 7th International Conference on, 606. https://doi.org/10.1109/AIEA70743.2026.11632653
Παραπομπή σε μορφή Chicago (17η εκδ.)Sun, Minqi, Jianyin Zhao, Yufeng Qin, και Youwei Hu. "Small-Sample Reliability Assessment Based on Bayesian Prior and Dynamic Wiener Process." 2026 7th International Conference on Artificial Intelligence and Electromechanical Automation (AIEA), Artificial Intelligence and Electromechanical Automation (AIEA), 2026 7th International Conference on 2026: 606. https://doi.org/10.1109/AIEA70743.2026.11632653.
Παραπομπή σε μορφή MLA (9th εκδ.)Sun, Minqi, et al. "Small-Sample Reliability Assessment Based on Bayesian Prior and Dynamic Wiener Process." 2026 7th International Conference on Artificial Intelligence and Electromechanical Automation (AIEA), Artificial Intelligence and Electromechanical Automation (AIEA), 2026 7th International Conference on, 2026, p. 606, https://doi.org/10.1109/AIEA70743.2026.11632653.