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Scale-Normalized Multi-Scale Spectral–Geometric Invariants for Robust 3D Shape Analysis

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Τίτλος: Scale-Normalized Multi-Scale Spectral–Geometric Invariants for Robust 3D Shape Analysis
Συγγραφείς: Djumanov, Jamoljon, Raxmanov, Raxmanbergan, Otaboyeva, Munisa, Rakhimboeva, Shakhnoza, Mehrangiz, Murodova, Ahmedova, Zebixon
Πηγή: 2026 IEEE 27th International Conference of Young Professionals in Electron Devices and Materials (EDM) Young Professionals in Electron Devices and Materials (EDM), 2026 IEEE 27th International Conference of. :1-6 Jun, 2026
Relation: 2026 IEEE 27th International Conference of Young Professionals in Electron Devices and Materials (EDM)
Βάση Δεδομένων: IEEE Xplore Digital Library
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Header DbId: edseee
DbLabel: IEEE Xplore Digital Library
An: edseee.11632108
RelevancyScore: 1161
AccessLevel: 2
PubType: Conference
PubTypeId: conference
PreciseRelevancyScore: 1160.626953125
IllustrationInfo
Items – Name: Title
  Label: Title
  Group: Ti
  Data: Scale-Normalized Multi-Scale Spectral–Geometric Invariants for Robust 3D Shape Analysis
– Name: Author
  Label: Authors
  Group: Au
  Data: <searchLink fieldCode="AR" term="%22Djumanov%2C+Jamoljon%22">Djumanov, Jamoljon</searchLink><br /><searchLink fieldCode="AR" term="%22Raxmanov%2C+Raxmanbergan%22">Raxmanov, Raxmanbergan</searchLink><br /><searchLink fieldCode="AR" term="%22Otaboyeva%2C+Munisa%22">Otaboyeva, Munisa</searchLink><br /><searchLink fieldCode="AR" term="%22Rakhimboeva%2C+Shakhnoza%22">Rakhimboeva, Shakhnoza</searchLink><br /><searchLink fieldCode="AR" term="%22Mehrangiz%2C+Murodova%22">Mehrangiz, Murodova</searchLink><br /><searchLink fieldCode="AR" term="%22Ahmedova%2C+Zebixon%22">Ahmedova, Zebixon</searchLink>
– Name: TitleSource
  Label: Source
  Group: Src
  Data: 2026 IEEE 27th International Conference of Young Professionals in Electron Devices and Materials (EDM) Young Professionals in Electron Devices and Materials (EDM), 2026 IEEE 27th International Conference of. :1-6 Jun, 2026
– Name: NoteTitleSource
  Label: Relation
  Group: SrcInfo
  Data: 2026 IEEE 27th International Conference of Young Professionals in Electron Devices and Materials (EDM)
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=edseee&AN=edseee.11632108
RecordInfo BibRecord:
  BibEntity:
    Identifiers:
      – Type: doi
        Value: 10.1109/EDM69524.2026.11632108
    PhysicalDescription:
      Pagination:
        PageCount: 6
        StartPage: 1
    Titles:
      – TitleFull: Scale-Normalized Multi-Scale Spectral–Geometric Invariants for Robust 3D Shape Analysis
        Type: main
  BibRelationships:
    HasContributorRelationships:
      – PersonEntity:
          Name:
            NameFull: Djumanov, Jamoljon
      – PersonEntity:
          Name:
            NameFull: Raxmanov, Raxmanbergan
      – PersonEntity:
          Name:
            NameFull: Otaboyeva, Munisa
      – PersonEntity:
          Name:
            NameFull: Rakhimboeva, Shakhnoza
      – PersonEntity:
          Name:
            NameFull: Mehrangiz, Murodova
      – PersonEntity:
          Name:
            NameFull: Ahmedova, Zebixon
    IsPartOfRelationships:
      – BibEntity:
          Dates:
            – D: 27
              M: 06
              Type: published
              Y: 2026
          Identifiers:
            – Type: isbn-print
              Value: 9798331547950
            – Type: isbn-print
              Value: 9798331547967
            – Type: issn-print
              Value: 2325419X
            – Type: issn-print
              Value: 23254173
            – Type: issn-locals
              Value: edseee.IEEEConferenc
          Titles:
            – TitleFull: 2026 IEEE 27th International Conference of Young Professionals in Electron Devices and Materials (EDM), Young Professionals in Electron Devices and Materials (EDM), 2026 IEEE 27th International Conference of
              Type: main
ResultId 1