Conference

Understanding Artifacts of Parallel Micro-Traffic Simulation

Bibliographic Details
Title: Understanding Artifacts of Parallel Micro-Traffic Simulation
Authors: Kim, Joon-Seok, Thakur, Gautam Malviya, Christopher, Carter
Source: 2026 27th IEEE International Conference on Mobile Data Management (MDM) MDM Mobile Data Management (MDM), 2026 27th IEEE International Conference on. :23-32 Jun, 2026
Relation: 2026 27th IEEE International Conference on Mobile Data Management (MDM)
Database: IEEE Xplore Digital Library
Description
ISBN:9798319533104
9798319545435
ISSN:23750324
15516245
DOI:10.1109/MDM71479.2026.00014