Mapping and Communication Optimizations with Fault Tolerance for Wafer-Scale LLM Inference

Λεπτομέρειες βιβλιογραφικής εγγραφής
Τίτλος: Mapping and Communication Optimizations with Fault Tolerance for Wafer-Scale LLM Inference
Συγγραφείς: Cui, Junwei, Qin, Le, Cai, Weilin, Huang, Jiayi
Πηγή: 2026 ACM/IEEE 53rd Annual International Symposium on Computer Architecture (ISCA) ISCA Computer Architecture (ISCA), 2026 ACM/IEEE 53rd Annual International Symposium on. :951-968 Jun, 2026
Relation: 2026 ACM/IEEE 53rd Annual International Symposium on Computer Architecture (ISCA)
Βάση Δεδομένων: IEEE Xplore Digital Library
Περιγραφή
ISBN:9798331550653
9798331550660
DOI:10.1109/ISCA66397.2026.00076