Detection and Resolution of Low-Contrast Local Defects Using an Electromagnetic Jet Lens Applied to RF Shielding Materials

Λεπτομέρειες βιβλιογραφικής εγγραφής
Τίτλος: Detection and Resolution of Low-Contrast Local Defects Using an Electromagnetic Jet Lens Applied to RF Shielding Materials
Συγγραφείς: Granger, Mathis, Bayard, Bernard, Sauviac, Bruno
Πηγή: 2026 107th ARFTG Microwave Measurement Conference (ARFTG) ARFTG Microwave Measurement Conference (ARFTG), 2026 107th. :1-6 Jun, 2026
Relation: 2026 107th ARFTG Microwave Measurement Conference (ARFTG)
Βάση Δεδομένων: IEEE Xplore Digital Library
Περιγραφή
ISBN:9798319521309
9798319521316
ISSN:27678776
28361407
DOI:10.1109/ARFTG68740.2026.11614642