APA (7th ed.) Citation

Granger, M., Bayard, B., & Sauviac, B. (2026). Detection and Resolution of Low-Contrast Local Defects Using an Electromagnetic Jet Lens Applied to RF Shielding Materials. 2026 107th ARFTG Microwave Measurement Conference (ARFTG), ARFTG Microwave Measurement Conference (ARFTG), 2026 107th, 1. https://doi.org/10.1109/ARFTG68740.2026.11614642

Chicago Style (17th ed.) Citation

Granger, Mathis, Bernard Bayard, and Bruno Sauviac. "Detection and Resolution of Low-Contrast Local Defects Using an Electromagnetic Jet Lens Applied to RF Shielding Materials." 2026 107th ARFTG Microwave Measurement Conference (ARFTG), ARFTG Microwave Measurement Conference (ARFTG), 2026 107th 2026: 1. https://doi.org/10.1109/ARFTG68740.2026.11614642.

MLA (9th ed.) Citation

Granger, Mathis, et al. "Detection and Resolution of Low-Contrast Local Defects Using an Electromagnetic Jet Lens Applied to RF Shielding Materials." 2026 107th ARFTG Microwave Measurement Conference (ARFTG), ARFTG Microwave Measurement Conference (ARFTG), 2026 107th, 2026, p. 1, https://doi.org/10.1109/ARFTG68740.2026.11614642.