Rathore, K., van Santen, V., Fischer, S., & Amrouch, H. (2026). Reliability-Aware Behavioral Modeling of Automotive Safety-Critical ASICs With Response Surface Methodology. IEEE Transactions on Circuits and Systems I: Regular Papers, Circuits and Systems I: Regular Papers, IEEE Transactions on, IEEE Trans. Circuits Syst. I, 73(10), 6685. https://doi.org/10.1109/TCSI.2026.3712066
Chicago Style (17th ed.) CitationRathore, K., V.M van Santen, S. Fischer, and H. Amrouch. "Reliability-Aware Behavioral Modeling of Automotive Safety-Critical ASICs With Response Surface Methodology." IEEE Transactions on Circuits and Systems I: Regular Papers, Circuits and Systems I: Regular Papers, IEEE Transactions on, IEEE Trans. Circuits Syst. I 73, no. 10 (2026): 6685. https://doi.org/10.1109/TCSI.2026.3712066.
MLA (9th ed.) CitationRathore, K., et al. "Reliability-Aware Behavioral Modeling of Automotive Safety-Critical ASICs With Response Surface Methodology." IEEE Transactions on Circuits and Systems I: Regular Papers, Circuits and Systems I: Regular Papers, IEEE Transactions on, IEEE Trans. Circuits Syst. I, vol. 73, no. 10, 2026, p. 6685, https://doi.org/10.1109/TCSI.2026.3712066.