Oosterhuis, M., & Liu, Q. (2026). Subject Leakage and Label Circularity in Deep Learning Models for Alzheimer’s Disease Prediction. 2026 IEEE Canadian Conference on Electrical and Computer Engineering (CCECE), Electrical and Computer Engineering (CCECE), 2026 IEEE Canadian Conference, 1. https://doi.org/10.1109/CCECE68150.2026.11610123
Παραπομπή σε μορφή Chicago (17η εκδ.)Oosterhuis, Maximilien, και Qian Liu. "Subject Leakage and Label Circularity in Deep Learning Models for Alzheimer’s Disease Prediction." 2026 IEEE Canadian Conference on Electrical and Computer Engineering (CCECE), Electrical and Computer Engineering (CCECE), 2026 IEEE Canadian Conference 2026: 1. https://doi.org/10.1109/CCECE68150.2026.11610123.
Παραπομπή σε μορφή MLA (9th εκδ.)Oosterhuis, Maximilien, και Qian Liu. "Subject Leakage and Label Circularity in Deep Learning Models for Alzheimer’s Disease Prediction." 2026 IEEE Canadian Conference on Electrical and Computer Engineering (CCECE), Electrical and Computer Engineering (CCECE), 2026 IEEE Canadian Conference, 2026, p. 1, https://doi.org/10.1109/CCECE68150.2026.11610123.