Conference
BESSER-TestGen: Automated Model-based Unit Test Generation for Low-Code Applications
| Τίτλος: | BESSER-TestGen: Automated Model-based Unit Test Generation for Low-Code Applications |
|---|---|
| Συγγραφείς: | Haq, Fitash Ul, Cabot, Jordi |
| Πηγή: | 2026 IEEE International Conference on Software Testing, Verification and Validation (ICST) ICST Software Testing, Verification and Validation (ICST), 2026 IEEE International Conference on. :206-210 May, 2026 |
| Relation: | 2026 IEEE International Conference on Software Testing, Verification and Validation (ICST) |
| Βάση Δεδομένων: | IEEE Xplore Digital Library |
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