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BESSER-TestGen: Automated Model-based Unit Test Generation for Low-Code Applications

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Τίτλος: BESSER-TestGen: Automated Model-based Unit Test Generation for Low-Code Applications
Συγγραφείς: Haq, Fitash Ul, Cabot, Jordi
Πηγή: 2026 IEEE International Conference on Software Testing, Verification and Validation (ICST) ICST Software Testing, Verification and Validation (ICST), 2026 IEEE International Conference on. :206-210 May, 2026
Relation: 2026 IEEE International Conference on Software Testing, Verification and Validation (ICST)
Βάση Δεδομένων: IEEE Xplore Digital Library
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        Value: 10.1109/ICST69053.2026.00036
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              Y: 2026
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