Haq, F. U., & Cabot, J. (2026). BESSER-TestGen: Automated Model-based Unit Test Generation for Low-Code Applications. 2026 IEEE International Conference on Software Testing, Verification and Validation (ICST), Software Testing, Verification and Validation (ICST), 2026 IEEE International Conference on, ICST, 206. https://doi.org/10.1109/ICST69053.2026.00036
Παραπομπή σε μορφή Chicago (17η εκδ.)Haq, Fitash Ul, και Jordi Cabot. "BESSER-TestGen: Automated Model-based Unit Test Generation for Low-Code Applications." 2026 IEEE International Conference on Software Testing, Verification and Validation (ICST), Software Testing, Verification and Validation (ICST), 2026 IEEE International Conference on, ICST 2026: 206. https://doi.org/10.1109/ICST69053.2026.00036.
Παραπομπή σε μορφή MLA (9th εκδ.)Haq, Fitash Ul, και Jordi Cabot. "BESSER-TestGen: Automated Model-based Unit Test Generation for Low-Code Applications." 2026 IEEE International Conference on Software Testing, Verification and Validation (ICST), Software Testing, Verification and Validation (ICST), 2026 IEEE International Conference on, ICST, 2026, p. 206, https://doi.org/10.1109/ICST69053.2026.00036.