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Test Design and Review Argumentation in AI-Assisted Test Generation

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Τίτλος: Test Design and Review Argumentation in AI-Assisted Test Generation
Συγγραφείς: Enoiu, Eduard Paul, Feldt, Robert
Πηγή: 2026 IEEE International Conference on Software Testing, Verification and Validation Workshops (ICSTW) ICSTW Software Testing, Verification and Validation Workshops (ICSTW), 2026 IEEE International Conference on. :159-162 May, 2026
Relation: 2026 IEEE International Conference on Software Testing, Verification and Validation Workshops (ICSTW)
Βάση Δεδομένων: IEEE Xplore Digital Library
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        Value: 10.1109/ICSTW72326.2026.00039
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        PageCount: 4
        StartPage: 159
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              Type: published
              Y: 2026
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