Conference
Black-Box Test Generation from State Machine Specifications via Mutation and Model Checking
| Τίτλος: | Black-Box Test Generation from State Machine Specifications via Mutation and Model Checking |
|---|---|
| Συγγραφείς: | Oda, Futa, Tsuchiya, Tatsuhiro |
| Πηγή: | 2026 IEEE International Conference on Software Testing, Verification and Validation Workshops (ICSTW) ICSTW Software Testing, Verification and Validation Workshops (ICSTW), 2026 IEEE International Conference on. :265-269 May, 2026 |
| Relation: | 2026 IEEE International Conference on Software Testing, Verification and Validation Workshops (ICSTW) |
| Βάση Δεδομένων: | IEEE Xplore Digital Library |
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