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Black-Box Test Generation from State Machine Specifications via Mutation and Model Checking

Bibliographic Details
Title: Black-Box Test Generation from State Machine Specifications via Mutation and Model Checking
Authors: Oda, Futa, Tsuchiya, Tatsuhiro
Source: 2026 IEEE International Conference on Software Testing, Verification and Validation Workshops (ICSTW) ICSTW Software Testing, Verification and Validation Workshops (ICSTW), 2026 IEEE International Conference on. :265-269 May, 2026
Relation: 2026 IEEE International Conference on Software Testing, Verification and Validation Workshops (ICSTW)
Database: IEEE Xplore Digital Library
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PubType: Conference
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  Data: Black-Box Test Generation from State Machine Specifications via Mutation and Model Checking
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  Data: 2026 IEEE International Conference on Software Testing, Verification and Validation Workshops (ICSTW) ICSTW Software Testing, Verification and Validation Workshops (ICSTW), 2026 IEEE International Conference on. :265-269 May, 2026
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  Data: 2026 IEEE International Conference on Software Testing, Verification and Validation Workshops (ICSTW)
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RecordInfo BibRecord:
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    Identifiers:
      – Type: doi
        Value: 10.1109/ICSTW72326.2026.00051
    PhysicalDescription:
      Pagination:
        PageCount: 5
        StartPage: 265
    Titles:
      – TitleFull: Black-Box Test Generation from State Machine Specifications via Mutation and Model Checking
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            NameFull: Oda, Futa
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            NameFull: Tsuchiya, Tatsuhiro
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          Dates:
            – D: 18
              M: 05
              Type: published
              Y: 2026
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