Oda, F., & Tsuchiya, T. (2026). Black-Box Test Generation from State Machine Specifications via Mutation and Model Checking. 2026 IEEE International Conference on Software Testing, Verification and Validation Workshops (ICSTW), Software Testing, Verification and Validation Workshops (ICSTW), 2026 IEEE International Conference on, ICSTW, 265. https://doi.org/10.1109/ICSTW72326.2026.00051
Παραπομπή σε μορφή Chicago (17η εκδ.)Oda, Futa, και Tatsuhiro Tsuchiya. "Black-Box Test Generation from State Machine Specifications via Mutation and Model Checking." 2026 IEEE International Conference on Software Testing, Verification and Validation Workshops (ICSTW), Software Testing, Verification and Validation Workshops (ICSTW), 2026 IEEE International Conference on, ICSTW 2026: 265. https://doi.org/10.1109/ICSTW72326.2026.00051.
Παραπομπή σε μορφή MLA (9th εκδ.)Oda, Futa, και Tatsuhiro Tsuchiya. "Black-Box Test Generation from State Machine Specifications via Mutation and Model Checking." 2026 IEEE International Conference on Software Testing, Verification and Validation Workshops (ICSTW), Software Testing, Verification and Validation Workshops (ICSTW), 2026 IEEE International Conference on, ICSTW, 2026, p. 265, https://doi.org/10.1109/ICSTW72326.2026.00051.