Conference
Application-oriented Capacitor Testing Method with Realistic Electro-thermal Stress Emulation
| Τίτλος: | Application-oriented Capacitor Testing Method with Realistic Electro-thermal Stress Emulation |
|---|---|
| Συγγραφείς: | Yao, Bo, Wang, Zhaoxin, Wei, Xing, Zhang, Yichi, Qi, Lei, Wang, Huai |
| Πηγή: | 2026 International Power Electronics Conference (IPEC-Nagasaki 2026 - ECCE Asia) Power Electronics Conference (IPEC-Nagasaki 2026- ECCE Asia), 2026 International. :1-5 May, 2026 |
| Relation: | 2026 International Power Electronics Conference (IPEC-Nagasaki 2026- ECCE Asia) |
| Βάση Δεδομένων: | IEEE Xplore Digital Library |
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